Optical Measure Head (USD 350)

Optical AFM head optimized for side illumination of visible light. Used with high NA off-axis parabolic mirror or lens for tip illumination (should be additionally included). Additional optical access to cantilever from top using objective for sample visualization and optical excitation & collection. Cantilever registration system alignment: manual, using high precision mechanics. Head base is made of titanium for lowest thermal drifts. Supports all contact and semicontact AFM measuring modes in air (AFM, EFM, KPM, SCM etc.); except spreading resistance imaging (measuring local electrical current through tip): this mode requires additional measuring insert.