SIMS crater bottom at low energy and rotating stage mode on crystalline silicon sample.
Image courtesy of Erica Iacob, Physics Chemistry of Surfaces and Interfaces Division, ITC-irst Center for Scientific and Technological.
SIMS crater bottom at low energy and rotating stage mode on crystalline silicon sample.
Image courtesy of Erica Iacob, Physics Chemistry of Surfaces and Interfaces Division, ITC-irst Center for Scientific and Technological.
SIMS crater bottom at low energy and rotating stage mode on crystalline silicon sample.
Image courtesy of Erica Iacob, Physics Chemistry of Surfaces and Interfaces Division, ITC-irst Center for Scientific and Technological.