L

LAX

Los Angeles International Airport

LDOS

local density of states

LEIS

LEIS
Localized Electrochemical Impedance Spectroscopy
http://www.uniscan.co.uk/leis270frame.html

LER

Line Edge Roughness (LER)
The deviation of a feature edge (as viewed top down) from a smooth, ideal shape. That is, the edge deviations of a feature that occur on a dimensional scale much smaller than the resolution limit of the imaging tool that was used to print the feature.
LER - Local line-edge variation (3 sigma total, all frequency component included, both edges) evaluated along a distance that allows determination of spatial wavelength equal to times the technology node. (ITRS Roadmap 2004)

LES

Light Emission Spectroscopy
Rev. Sci. Instr. 72, 2097 (2000).

LFM

Lateral Force Microscopy
Phys. Rev. Lett, 59, 1942 (1987).

lift-mode

In lift-mode operation the scanning is divided into two parts and with a first scan to obtain and store topographical information and with a second scan to measure the parameter of the surface other than topography or to perform t he task while the probe height is controlled using the stored topographic information.
US Pat. 5308974

LLC

limited liability company
компания с ограниченной ответственностью

LMM

Lateral Modulation Mode
Nanotechnology 2, (1991) 103.

LS SPM

Large Sample SPM

LT SPM

Low Temperature SPM

LWR

Line Width Roughness.
LWR is defined as LWR=sqrt(2)LER for uncorrelated line edge roughness.

LWU

line width uniformity

LZT

Landing Zone Textured (Hard Disk)
Laser Zone Texturing