+86 21 6079 0303
+86 135 2487 5604
Integrated Solutions for Nano-technology
Products
Applications
Scan-Gallery
Resources
About us
Contact us
Home
Resources
SPM Theory
Theoretical background of SPM
1. Scanning Tunnel Microscopy (STM)
1.2 Tunnel Current in MIM System
1.2 Tunnel Current in MIM System
1.2.1 John G. Simmons Formula
1.2.2 John G. Simmons Formula in a Case of Small, Intermediate and High Voltage (Field Emission Mode).
1.2.1 Appendix
Have more questions? Contact us +7-499-110-2050
or fulfill a form and we will answer all your questions.
Ask an Expert
Send us your request
For technical support please use our
Ask Online system
* - Required fields.
Send
Accept privacy policy
