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SPM Theory
Theoretical background of SPM
2. Scanning Force Microscopy (SFM)
2.6 Probe-Sample Interaction: Lateral Forces
2.6 Probe-Sample Interaction: Lateral Forces
2.6.1 The nature of frictional forces
2.6.2 Cantilever deformations under the influence of lateral forces
2.6.3 Calibration of the optical detection system
2.6.4 Qualitative interpretation of results
2.6.5 Stick-slip motion on the nanoscale
2.6.6 Stick-slip phenomenon on the microscale
2.6.7 Appendices
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