Data Processing and Representation in Atomic Force Microscopy
25.05.2016
Dr. Stanislav I. Leesment
The webinar took place on May 25, 2016.
Images in Atomic Force Microscopy usually contain a number of specific distortions and artifacts. Correct way of AFM Data processing and its representation is very important for further quantitative analysis.
During the webinar we go through various examples of common image processing procedures such as flattening, filtering, etc. and show the ways of perceptual data representation.
Image Analysis 3.5 download link