Combination of QCM with dissipation monitoring with AFM allows to carry out simultaneous in situ observation of object topography (up to nm) and mass change (up to 0.3 ng).
NT-MDT China is introducing a new THERMAL CABINET, which provides a low-thermal drift environment for scanning probe microscopes: NEXT, NTEGRA Prima, and Titanium.
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NT-MDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface.
RapidScan technology is a combination of mechanical design and high-end digital electronical solutions which allows to speed up your AFM by an order of magnitude keeping 90 µm in-plane scaninng range. All three access are equipped with high-precision closed-loop capacitive sensors.
